Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics - - Books - Elsevier Science Publishing Co Inc - 9780123813107 - June 21, 2011
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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics

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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

752 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 21, 2011
ISBN13 9780123813107
Publishers Elsevier Science Publishing Co Inc
Pages 752
Dimensions 152 × 229 × 40 mm   ·   1.17 kg
Series Editor Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics)